欢迎登录材料期刊网

材料期刊网

高级检索

利用放电等离子烧结技术制备了宽带隙三元半导体化合物CuIn5Se8,并对其热电性能进行了研究.物相分析表明,化合物为单相CuIn5Se8,带隙宽度为1.13 eV,比In2Se3合金的低.电学性能测试结果表明,随温度升高Seebeck系数绝对值从370.0 μV·K-1降低到263.0 μV·K-1,而电导率则随温度迅速增大.在818 K时,其电导率达到最大值2.92× 103 Ω-1·m-1,热导率为0.50 W.K-1·m-1,最高热电优值ZT值达到0.33.

参考文献

[1] Afifi MA.;Bekheet AE.;Hegab NA. .EFFECT OF ANNEALING ON THE ELECTRICAL PROPERTIES OF IN2SE3 THIN FILMS[J].Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology,1995(4):335-339.
[2] Kaminskii V M;Kovalyuk Z D;Zaslonkin A V et al.[J].Semiconductor Physics Quantum Electronics & Optoelectronics,2009,12(03):290.
[3] Fotsing J;Julien C;Balkanski M.[J].Materials and Engineering BI,1988:139.
[4] Sreekumar R;Jayakrishnan R;Kartha CS;Vijayakumar KP;Kashibawa Y;Abe T .Different phases of indium selenide prepared by annealing In/Se bilayer at various temperatures: Characterization studies[J].Solar Energy Materials and Solar Cells: An International Journal Devoted to Photovoltaic, Photothermal, and Photochemical Solar Energy Conversion,2006(17):2908-2917.
[5] Watanabe Y C;Kaneko S C;Kawazoe H S et al.[J].Physical Review B,1989,40(05):3133.
[6] Chaiken A;Nauka K;Gibson G A et al.[J].Journal of Applied Physics,2003,94(04):2390.
[7] de Groot CH.;Moodera JS. .Growth and characterization of a novel In2Se3 structure[J].Journal of Applied Physics,2001(8):4336-4340.
[8] Rhyee J S;Lee K H;Lee S M et al.[J].Nature,2009,459:965.
[9] Chiritescu, C;Cahill, DG;Nguyen, N;Johnson, D;Bodapati, A;Keblinski, P;Zschack, P .Ultralow thermal conductivity in disordered, layered WSe2 crystals[J].Science,2007(26):351-353.
[10] Tseng B H;Wert C A .[J].Journal of Applied Physics,1989,65(06):2254.
[11] Tham AT.;Neumann W.;Schubert-Bischoff P.;Beilharz C.;Benz KW.;Su DS. .Transmission electron microscopical studies of the layered structure of the ternary semiconductor CuIn5Se8[J].Crystal Research and Technology: Journal of Experimental and Industrial Crystallography,2001(3):303-308.
[12] Hernandez E.;Duran L.;Rincon CAD.;Aranguren G.;Guerrero C.;Naranjo J. .Electrical resistivity and thermally stimulated current in CuLn(5)Se(8)[J].Crystal Research and Technology: Journal of Experimental and Industrial Crystallography,2002(11):1227-1233.
[13] Wasim S M;Rincon C;Marin G et al.[J].Applied Physics Letters,2000,77(01):94.
[14] Zhang SB;Wei SH;Zunger A .Stabilization of ternary compounds via ordered arrays of defect pairs[J].Physical review letters,1997(21):4059-4062.
[15] Zhang SB.;Zunger A.;Katayama-Yoshida H.;Wei SH. .Defect physics of the CuInSe2 chalcopyrite semiconductor [Review][J].Physical Review.B.Condensed Matter,1998(16):9642-9656.
[16] Cui J L;Liu X L;Zhang X J et al.[J].Journal of Applied Physics,2011,110:023708.
[17] Cui J L;Zhang X J;Deng Y et al.[J].Scripta Materialia,2011,64:510.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%