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采用355nm脉冲激光沉积(PLD)法以Li6.16V0.61Si0.39O5.36为靶制备了Li2O-V2O5-SiO2薄膜.由X射线衍射(XRD)、扫描电子显微镜(SEM)、表面轮廓、交流阻抗(ACI)、直流极化(DCP)等方法对薄膜的形貌、结构及电化学性能进行表征,讨论了Li2O-V2O5-SiO2薄膜电化学性能与其结构的关系.结果表明,该薄膜是一种无针孔和裂缝、厚度均匀、组成致密的非晶态结构;Li2O-V2O5-SiO2薄膜离子电导率与温度符合Arrhenius关系,离子迁移数接近1.0(tion>99.999%),是一种性能良好的离子导体材料;Li2O-V2O5-SiO2薄膜室温时离子电导率达4.0×10-7S/cm,而电子电导率仅为10-11~10-12S/cm,可作为电解质材料用于全固态薄膜锂电池.

参考文献

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