采用固体粉末渗硼法对TC4钛合金基体表面进行渗硼试验.通过扫描电镜(SEM)、能谱(EDS)与X射线衍射(XRD)研究TC4钛合金渗硼后的物相组成和组织形貌,讨论渗硼过程中元素的扩散行为.结果表明:在1000,1050和1100℃分别保温5,20 h后,渗层由外表层的TiB2和内表层的TiB晶须组成,渗层厚度范围为0.8～15μm.XRD分析表明:TC4钛合金渗硼后形成TiB2与TiB双相硼钛化合物层,随着温度的升高,TiB2与TiB的峰位增多;EDS分析得出表层B原子被TCA钛合金吸附后与基体的Ti化合导致过渡区域内的Ti含量减少,同时Al和V元素开始向基体扩散并在近界面处富集.渗层的显微硬度呈梯度分布,TiB2到TiB晶须维氏硬度值的变化范围为22 000～11 000 MPa,过渡区的硬度值要高于基体的硬度值.
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