The image stress of straight screw dislocations parallel to the medium surface covered by thin heterogeneous films was analyzed and deduced, in order to calculate the image shear stress. The relationship between image stress and distance from the screw dislocation to the interface of pure aluminum and its oxide covering was calculated based on the analysis. It was shown quantitatively that a sign conversion of the image stress appears in the case of thin oxide covering, while dislocation would pile up near the interface because of the possible slips of the screw dislocations induced by the image stress, which might break down the very thin oxide covering. Further investigation on edge dislocations or other dislocation configurations need to be done.
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