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用等离子体增强化学气相沉积(PECVD) 的方法,以固定的氢气(H2)流量和不同的硅烷(SiH4)和甲烷(CH4)流量比沉积了一系列的氢化非晶SiC(a-SixC1-x-H)膜.用这种宽带隙的a-SixC1-x-H材料作为掺铒的基体材料,通过离子注入的方法得到掺铒的a-SixC1-x-H(a-SixC1-x-H:Er)膜.注入以后的样品经过不同温度的退火.用X射线光电子能谱(XPS)、红外吸收光谱(IR)、拉曼散射谱(Raman)等技术研究不同的SiH4/CH4流量比和退火温度对a-SixC1-x-H:Er发光强度的影响.结果表明,高温退火引起了膜中C的分凝,对铒的发光是不利的.通过低温和室温下铒发光强度的比较,表明这种材料具有较弱的温度猝灭效应.

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