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采用多靶反应磁控溅射设备制备了一系列不同基体负偏压的W-C-N复合膜.采用X射线衍射仪、扫描电镜、能量色散谱仪、纳米压痕仪和摩擦磨损仪对薄膜进行表征.结果表明:当负偏压小于等于80 V时,薄膜表现出六方α-WCN相结构,增加到120 V时,转变为立方β-WCN相,薄膜硬度、弹性模量和膜基结合力出现对应最佳性能点的峰值;随着负偏压的增大,薄膜质量得到改善,磨损率和摩擦系数明显降低,负偏压达到200 V时,磨损率和摩擦系数分别出现最低值4.22×10-6 mm3·N-1 ·m-1和0.27;薄膜的磨损机制主要是磨粒磨损.

参考文献

[1] Kim KR.;Suh CM.;Murakami RI.;Chung CW. .Effect of intrinsic properties of ceramic coatings on fatigue behavior of Cr-Mo-V steels[J].Surface & Coatings Technology,2003(1/3):15-23.
[2] L. Cunha;M. Andritschky;L. Rebouta;R. Silva .Corrosion of TiN, (TiAl)N and CrN hard coatings produced by magnetron sputtering[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1998(1/2):351-355.
[3] Lee HY.;Han JG.;Baeg SH.;Yang SH. .Structure and properties of WC-CrAlN superlattice films by cathodic arc ion plating process[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2002(0):414-420.
[4] Cavaleiro A.;Trindade B.;Vieira MT. .Influence of Ti addition on the properties of W-Ti-C/N sputtered films[J].Surface & Coatings Technology,2003(0):68-75.
[5] C. Louro;A. Cavaleiro .Hardness versus structure in W-Si-N sputtered coatings[J].Surface & Coatings Technology,1999(0):74-80.
[6] 汪蕾,董师润,尤建飞,喻利花,李学梅,许俊华.Ti(C,N)复合膜和TiN/Ti(C,N)多层膜组织和显微硬度[J].材料热处理学报,2010(02):113-118.
[7] 喻利花,薛安俊,董松涛,许俊华.Si含量对Ti-Al-Si-N薄膜微结构与力学性能的影响[J].材料热处理学报,2010(07):140-145.
[8] 梅永晖,董松涛,熊宁,喻利花,许俊华.Al元素对Zr-Si-N复合膜的微结构与力学性能的影响[J].金属热处理,2009(11):1-5.
[9] 靳树强,董松涛,尤建飞,喻利花,许俊华.Zr-Al-N及Zr-Al-Si-N复合膜的微结构及力学性能[J].金属热处理,2009(10):12-16.
[10] Gesheva K A;Blakhov E S;Stoyanov G I et al.Deposition and characterization of CVD-tungsten and tungsten carbonitrides on (100) Si[J].Ceramics International,1996,22(01):87-89.
[11] Kim S D .Microstructural properties of plasma-enhanced chemical vapor deposited WNx films using WFr-H2-N2 precursor system[J].Current Applied Physics,2007,7(04):426-433.
[12] K.-E. Elers;V. Saanila;W.-M. Li;P.J. Soininen;J.T. Kostamo;S. Haukka;J. Juhanoja;W.F.A. Besling .Atomic layer deposition of W_xN/TiN and WN_xC_y/TiN nanolaminates[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2003(1/2):94-99.
[13] Su Y D;Hu C Q;Wen M et al.Effects of bias voltage and annealing on the structure and mechanical properties of WC0.75 N0.25 thin films[J].Journal of Alloys and Compounds,2009,486(1-2):357.
[14] Ospina-Ospina, R.;Jurado, J.F.;Vélez, J.M.;Arango, P.J.;Salazar-Enríquez, C.;Restrepo-Parra, E. .Structural and morphological characterization WCxNy thin films grown by pulsed vacuum arc discharge in an argon-nitrogen atmosphere[J].Surface & Coatings Technology,2010(7):2191-2196.
[15] Oh U C;Je J H .Effects of strain energy on the preferred orientation of TiN thin films[J].Journal of Applied Physics,1993,74(03):1692-1696.
[16] Sellers J. .Asymmetric bipolar pulsed DC: the enabling technology for reactive PVD[J].Surface & Coatings Technology,1998(1/3):1245-1250.
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