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研究了生长在GaN/Al2O3模板层上的InGaN合金的微结构形态,并通过Raman光谱测定了InGaN合金的晶相,采用分光镜椭圆测量对InGaN合金的光学带隙进行了研究,分析了InGaN合金带隙产生Stokes偏移的本质及原因.AFM显微图表明生长在GaN/Al2O3模板层上的InGaN合金的微结构晶体质量得到了很好的改善.In-CaN合金的Raman光谱曲线非常微弱,与GaN/Al2O3的Raman光谱曲线几乎完全重叠.通过分光镜椭圆测量可知,InGaN合金的光学带隙Eg随着In含量的增加而减少.InGaN合金在红外区域表现出强烈的光致发光峰,随着Ga含量的增加,光致发光峰表现出较大的蓝移即Stokes偏移.在InGaN合金的中间In组分附近Stokes偏移达到最大值.产生Stokes偏移的主要原因是InN在GaN中具有较低的混溶性.Stokes偏移也可归结为InGaN合金中存在局域态,InGaN合金中栽流子的局域化程度越高,Stokes偏移就越大.

参考文献

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