本文以温度涨落和微观结构背景涨落为基础,研究了固体材料中晶粒、有序畴、弥散相粒子、辐照缺陷团、疲劳微裂纹等图样长大的普遍统计表述,给出了随机长大方程,导出了各种图样的统计分布函数和平均尺度。
The general statistical nature of pattern growth such as grains,ordered do-mains,precipitate particles,radiation defect groups and fatigue microcracks has been inves-tigated based on temperature fluctuation and microstructure background fluctuation.Thesto
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