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本文简述了光刻技术及光刻胶的发展过程,并对应用于193纳米光刻和下一代EUV光刻的光刻胶材料的研究进展进行了综述,特别对文献中EUV光刻胶材料的研发进行了较为详细的介绍,以期对我国先进光刻胶的研发工作有所帮助.

参考文献

[1] 郑金红.光刻胶的发展及应用[J].精细与专用化学品,2006(16):24-30.
[2] Pfeiffer F;Felix NM;Neuber C;Ober CK;Schmidt HW .Physical vapor deposition of molecular glass photoresists: A new route to chemically amplified patterning[J].Advanced functional materials,2007(14):2336-2342.
[3] Moore G E .Cramming more components onto integrated circuits[J].Electronics,1965,38:114-117.
[4] Wagner, C;Harned, N .EUV LITHOGRAPHY Lithography gets extreme[J].Nature photonics,2010(1):24-26.
[5] Tallents, G.;Wagenaars, E.;Pert, G. .Optical lithography: Lithography at EUV wavelengths[J].Nature photonics,2010(12):809-811.
[6] 郑金红.我国光刻胶的市场现状及发展趋势[J].精细与专用化学品,2009(09):28-31.
[7] Totzeck M;Ulrich W;Gohnermeier A;Kaiser W .Pushing deep ultraviolet lithography to its limits[J].Nature Photonics,2007,1:829-831.
[8] Ito T;Okazaki S .Pushing the limits of lithography[J].Nature,2000,406:1027-1031.
[9] Anscombe, N;Warlaumont, J .Pushing the limits[J].Nature photonics,2010(1):30-30.
[10] [OL].http://www.itrs.net/Links/2010ITRS/2010Update/ToPost/2010_Update_Overview.pdf
[11] Ito H;Willson C G .Chemical amplification in the design of dry developing resist materials[J].Polymer Engineering and Science,1983,23:1012.
[12] Macdonald S A;Willson C G;Frechet J M J .Chemical amplification in high-resolution imaging systems[J].Accounts of Chemical Research,1994,27:151.
[13] Shirai M;Tsunooka M .Photoacid and photobase generators:chemistry and applications to polymeric materials[J].Progress in Polymer Science,1996,21:1.
[14] Sanders D P .Advanced in patterning materials for 193 nm immersion lithography[J].Chemical Reviews,2010,110:321-360.
[15] Diakoumakos CD.;Raptis I.;Tserepi A.;Argitis P. .Free-radical synthesis of narrow polydispersed 2-hydroxyethyl methacrylate-based tetrapolymers for dilute aqueous base developable negative photoresists[J].Polymer: The International Journal for the Science and Technology of Polymers,2002(4):1103-1113.
[16] Li W;Varanasi P R;Lawson M C;Kwong R W,Chen K J,Ito H,Truong H,Allen R D,Yamamoto M,Kobayashi E,Slezak M .Rational design in cyclic olefin resists for sub-100-nm lithography[J].Proceedings of Spie,2003,61:5039.
[17] Hiroshi Ito .Development of New Advanced Resist Materials for Microlithography[J].Journal of Photopolymer Science and Technology,2008(4):475-491.
[18] Sooriyakumaran R;Sanders D P;Truong H;Allen R D Colburn M E Mclntyre G R.High refractive index polymer platforms for 193 nm immersion lithography[A].,2007
[19] Panagiotis Argitis;Dimitra Niakoula;Antonios M. Douvas;Evangelos Gogolides;Ioannis Raptis;Veroniki P. Vidali;Elias A. Couladouros .Materials for lithography in the nanoscale[J].International Journal of Nanotechnology,2009(1/2):71-87.
[20] 中国科学院理化技术研究所 .2011年国际光学工程学会先进光刻技术会议在美国召开(会讯)[J].影像科学与光化学,2011,29(03):233.
[21] Tadatomi Nishikubo;Hiroto Kudo .Recent Development in Molecular Resists for Extreme Ultraviolet Lithography[J].Journal of Photopolymer Science and Technology,2011(1):9-18.
[22] Kozawa T;Tagawa S .Radiation chemistry in chemically amplified resists[J].Japanese Journal of Applied Physics,2010,49:030001.
[23] Masamitsu Shirai;Koichi Maki;Haruyuki Okamura .Non-Chemically Amplified EUV Resist Based on PHS[J].Journal of Photopolymer Science and Technology,2009(1):111-116.
[24] Masamitsu Shirai;Koichi Maki;Haruyuki Okamura .Negative EUV Resist Based on Thiol-Ene System[J].Journal of Photopolymer Science and Technology,2010(5):687-691.
[25] Brian Cardineau;Seth Kruger;William Earley .Chain-Scission Polyesters for EUV Lithography[J].Journal of Photopolymer Science and Technology,2010(5):665-671.
[26] Kirsten J. Lawrie;Idriss Blakey;James P. Blinco .Chain scission resists for extreme ultraviolet lithography based on high performance polysulfone-containing polymers[J].Journal of Materials Chemistry: An Interdisciplinary Journal dealing with Synthesis, Structures, Properties and Applications of Materials, Particulary Those Associated with Advanced Technology,2011(15):5629-5637.
[27] Blakey I;Yu A-G;Blinco J;Jack K S,Liu H-P,Whittaker A K,Leeson M,Yueh W,Younkin T .Polycarbonate based nonchemically amplified photoresist for extreme ultraviolet lithography[J].Proceedings of Spie,2010,7636:763635.
[28] Dai JY;Chang SW;Hamad A;Yang D;Felix N;Ober CK .Molecular glass resists for high-resolution patterning[J].Chemistry of Materials: A Publication of the American Chemistry Society,2006(15):3404-3411.
[29] Kousuke Tsuchiya;Seung Wook Chang;Nelson M.Felix;Mitsuru Ueda;Christopher K.Ober .Lithography Based on Molecular Glasses[J].Journal of Photopolymer Science and Technology,2005(3):431-434.
[30] David L. VanderHart;Vivek M. Prabhu;Anuja De Silva .Solid state NMR investigation of photoresist molecular glasses including blend behavior with a photoacid generator[J].Journal of Materials Chemistry: An Interdisciplinary Journal dealing with Synthesis, Structures, Properties and Applications of Materials, Particulary Those Associated with Advanced Technology,2009(18):2683-2694.
[31] Frauke Pfeiffer;Nelson M. Felix;Christian Neuber .Towards environmentally friendly, dry deposited, water developable molecular glass photoresists[J].Physical chemistry chemical physics: PCCP,2008(9):1257-1262.
[32] Yang D;Chang SW;Ober CK .Molecular glass photoresists for advanced lithography[J].Journal of Materials Chemistry: An Interdisciplinary Journal dealing with Synthesis, Structures, Properties and Applications of Materials, Particulary Those Associated with Advanced Technology,2006(18):1693-1696.
[33] De Silva A;Lee JK;Andre X;Felix NM;Cao HB;Deng H;Ober CK .Study of the structure-properties relationship of phenolic molecular glass resists for next generation photolithography[J].Chemistry of Materials: A Publication of the American Chemistry Society,2008(4):1606-1613.
[34] Anuja De Silva;Christopher K.Ober .Hydroxyphenylbenzene derivatives as glass forming molecules for high resolution photoresists[J].Journal of Materials Chemistry: An Interdisciplinary Journal dealing with Synthesis, Structures, Properties and Applications of Materials, Particulary Those Associated with Advanced Technology,2008(16):1903-1910.
[35] Jing Sha;Jin-Kyun Lee;Shuhui Kang .Architectural Effects on Acid Reaction-Diffusion Kinetics in Molecular Glass Photoresists[J].Chemistry of Materials: A Publication of the American Chemistry Society,2010(10):3093-3098.
[36] Anuja De Silva;Linda K. Sundberg;Hiroshi Ito .A Fundamental Study on Dissolution Behavior of High-Resolution Molecular Glass Photoresists[J].Chemistry of Materials: A Publication of the American Chemistry Society,2008(23):7292-7300.
[37] Hiroaki Oizumi;Yuusuke Tanaka;Takaaki Kumise .Evaluation of New Molecular Resist for EUV Lithography[J].Journal of Photopolymer Science and Technology,2007(3):403-410.
[38] Owada T;Yomogita A;Kashiwamura T;Kusaba T Miyamoto S Takeya T.Development of novel positivetone resists for EUVL[J].SPIE,2009:7273.
[39] Tadatomi Nishikubo;Hiroto Kudo;Yuji Suyama .Novel Noria (Water Wheel-Like Cyclic Oligomer) Derivative as a Chemically Amplified Extreme Ultraviolet (EUV)-Resist Material[J].Journal of Photopolymer Science and Technology,2009(1):73-76.
[40] Hiroto Kudo;Mayumi Jinguji;Tadatomi Nishikubo .Extreme Ultraviolet (EUV)-Resist Materials of Noria (Water Wheel-Like Cyclic Oligomer) Derivatives containing Acetal Moieties[J].Journal of Photopolymer Science and Technology,2010(5):657-664.
[41] Niina N;Kudo H;Maruyama K;Kai T Shimokawa T Oizumi H Itani T Nishikubo T .Multicomponent negative-type photoresist based on Noria analog with 12 etboxy groups[J].Polymer Journal,2011,43:407-413.
[42] Yasuyuki Fukushima;Takeo Watanabe;Ryuji Ohnishi .PAG Study of PAG Bonded Resist for EUV and EB Lithography[J].Journal of Photopolymer Science and Technology,2008(4):465-468.
[43] James W. Thackeray;Emad Aqad;Su Jin Kang .Design Considerations for EUV Resist Materials[J].Journal of Photopolymer Science and Technology,2009(1):65-71.
[44] James W. Thackeray;Vipul Jain;Suzanne Coley .Optimization of Polymer-bound PAG (PBP) for 20nm EUV Lithography[J].Journal of Photopolymer Science and Technology,2011(2):179-183.
[45] Robert D. Allen;Phillip J. Brock;Young-Hye Na .Investigation of Polymer-bound PAGs: Synthesis, Characterization and Initial Structure/Property Relationships of Anion-bound Resists[J].Journal of Photopolymer Science and Technology,2009(1):25-29.
[46] Lawson R A;Lee C T;Yueh W;Tolbert L,Henderson C L.Water-developable negative-tone single-molecule resists:high-sensitivity nonchemically amplified resists[J].Proceedings of Spie,2008:6923.
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