采用金属有机物化学气相沉积(MOCVD)和离子注入的方法制备了掺铕 GaN薄膜. 利用Raman散射技术研究薄膜的晶格振动,从而确定离子注入引进的晶格损伤变化情况. 结果表明,Eu离子注入剂量越大,对晶格的损伤越严重;Eu离子注入的能量越高,对晶格的损伤也越严重;采用沟道注入方法可以有效地减小对晶体的损伤. 离子注入后进行高温退火,可以使晶格中的Ga空位引起的缺陷得到有效的恢复,而N空位引起的缺陷随着退火温度的升高先减少后增多. 不同几何配置的Raman谱研究表明,1000 ℃的高温退火导致了GaN的分解.
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