采用扫描电子显微镜和四探针技术研究了空穴掺杂系列样品Sr2xKxFeMoO6 (0≤x≤0.04)的输运性质.结果表明,空穴掺杂提高了该系列样品的结晶度,使颗粒均匀,空洞变少,晶粒尺寸由未掺杂时的约为2μm变化至掺杂量x=0.04时的约为1μm.四探针输运结果表明该系列样品的金属-绝缘体转变温度(TS-M)由未掺杂时的170K变化至掺杂量x=0.04时的72K.晶粒尺寸、阳离子有序、载流子浓度是影响Sr2-xKxFeMoO6输运性质的重要因素.
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