经典的火花源原子发射光谱(Spark-OES)及辉光放电原子发射光谱(GD-OES)较难分析不规则导电小样品,实验采用激光诱导击穿光谱(LIBS)法对电路板上的发光二极管(LED)管脚和印刷电路板(PCB)固定螺钉两个不规则细小样品表面的锈蚀进行了深度与成分分析.深度曲线表明发光二极管管脚样品表面镀有Sn、Ni、Cu等元素,螺钉样品表面镀有Ni元素,镀层界面下则是低合金钢材料.采用一套低合金钢GSBH40068-93建立校准曲线,可定量分析界面下铁基样品的C、Mn、P、S、Cu、Ni含量.发光二极管管脚及PCB的螺钉样品很细小,且表面生锈很严重,较难用湿法化学分析,在同样的分析参数条件下,对编号为11278的中低合金钢样品分别采用LIBS及Spark-OES进行准确度和精密度考察,结果表明二者准确度相吻合,但LIBS数据的精密度略逊于Spark-OES,除P、S元素外,其余元素的相对标准偏差(RSD)均在5％以下.
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