通过测定循环伏安曲线、镀层表面形貌和X射线衍射谱图,研究了单一的烷基糖苷(APG)或APG+槲皮素的组合添加剂对Sn-Ag-Cu三元合金共沉积的影响.镀液的基础组成和工艺条件为:Sn(CH3SO3)2 0.18 mol/L,Ag2O 0.006 mol/L,Cu(CH3SO3)2 0.001 2 mol/L,硫脲0.06 mol/L,羧乙基乙二胺三乙酸(HEDTA) 1.0 mol/L,pH 5.0,温度25℃,电流密度6.6 mA/cm2,时间30 min.结果表明,镀液中APG或APG+槲皮素的存在使锡离子的扩散系数减小,Sn-Ag-Cu三元合金的共沉积过程受阻.镀液中加入1.00 g/L APG或1.00 g/L APG+ 0.05 g/L槲皮素后,Sn-Ag-Cu镀层外观改善,镀层结晶细致、均匀,晶面择优取向由Sn(211)转变为Sn (200).因此,APG或APG与少量槲皮素的组合适合用作Sn-Ag-Cu共沉积的添加剂.
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