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INFLUENCE OF COMPOSITION AND DISPERSOID ON FATIGUE FRACTURE BEHAVIOUR OF Al-Mg-Si ALLOYS

JIANG Daming HONG Bande LEI Tingquan (T.C.LEI) Harbin Institute of Technology , Harbin , China Lecturer , Analysis and Measurement Center , Harbin Institute of Technology , Harbin 150006

金属学报(英文版)

A study was made of the fatigue fracture behaviour under different aging conditions of two Al-Mg-Si alloys with different chemical compositions and dispersoid contents.The dispersoid phase can alter the mode of the deformation uniformity of alloys.The dispersoid it- self may decohere from the dispersoid/matrix interface under cyclic stress to form small dimples.

关键词: AI-Mg-Si alloy , null , null , null

Analysis of Ground-State Zero-Field Splitting for Mn(2+) in ZnNbOF(5)center dot 6(H(2)O) and CoNbOF(5)center dot 6(H(2)O)

Chinese Physics Letters

The electron paramagnetic resonance spectra of trigonal Mn(2+) centers in ZnNbOF(5)center dot 6(H(2)O) and CoNbOF(5)center dot 6(H(2)O) crystals are studied on the basis of the complete energy matrices for a d(5) configuration ion in a trigonal ligand field. It is demonstrated that the local lattice structure around a trigonal Mn(2+) center has an elongation distortion along the crystalline c(3) axis, and when Mn(2+) is doped in the ZnNbOF(5)center dot 6(H(2)O) and CoNbOF(5)center dot 6(H(2)O) crystals, there is a similar local distortion. From the EPR calculation, the local lattice structure parameters for trigonal Mn(2+) centers in ZnNbOF(5)center dot 6(H(2)O) and CoNbOF(5)center dot 6(H(2)O) are determined.

关键词: phase-transition;ions;complexes;crystals;spectra;fe-3+;epr

EPR parameters and superposition model analysis for trigonal Dy3+-O2- center in CaF2 crystal

Physica B-Condensed Matter

On the basis of the defect model of trigonal Dy3+-O2- center in CaF2, the EPR parameters (g factors and hyperfine structure constants) for this trigonal center are calculated from the perturbation formulas. In the formulas, the contributions to EPR parameters due to the J-mixing among H-6(J) (J = 15/2, 13/2 and 11/2) states, the mixtures among the states with the same J-value and those between the lowest Kramers doublet Gamma(gamma) and other Kramers doublets Gamma(X) are included. In the calculation, the crystal field parameters are estimated from the superposition model. From the calculation, the EPR g factors g(\\), g(perpendicular to) are reasonably explained and the superposition model intrinsic parameters (A) over bar (2)(F-) and (A) over bar (2) (O2-) with R = 2.366 Angstrom are obtained. (C) 2003 Elsevier B.V. All rights reserved.

关键词: EPR parameters;crystal-field theory;superposition model;Dy3+;CaF2;electron-paramagnetic-resonance;field parameters;single-crystals;ions

Comparative analysis of the difference of local structure between EPR theory and X-ray diffraction experiment for NiSiF(6)center dot 6H(2)O crystal

Journal of Alloys and Compounds

The local structure for NiSiF(6)center dot 6H(2)O crystal has been investigated by diagonalizing the complete energy matrices, By simulating the EPR and optical spectra, the local structure parameter theta(0) = 54.8901 is determined at room temperature and is different from theta(0)' = 55.0899 obtained by X-ray diffraction experiment, suggesting that: (i) the H(+) ions lead to a deviation of the equivalent position of effective charge of H(2)O molecule from O(2) ion, (ii) the neighboring [siF(6)](2) octahedral clusters lead to a deflection of the H(2)O molecules towards them. The deviation angle Delta theta(0) = -0.1999 is reported for file first time. Furthermore, the local structure NiSiF(6)center dot 6H(2)O crystal has been determined it 4.2 and 77 K. (c) 2007 Elsevier B.V. All rights reserved.

关键词: Local structure;Complete energy matrices;EPR theory;X-ray diffraction;experiment;NiSiF(6)center dot 6H(2)O crystal;electron-paramagnetic-resonance;nickel fluosilicate;magnetic-resonance;optical absorption;field;pressure;cobalt;fe-3+;zinc;ion

A study of the passive films on chromium by capacitance measurement

Corrosion Science

Using capacitance measurement and Mott-Schottky analysis, the semiconducting properties of passive films formed on chromium within the passive potential range under different conditions were investigated. The study reveals a p-type behavior of the passive layers. Two semiconductive parameters, i.e., the acceptor density (N-A) and the flatband potential (E-FB), which are mainly related to composition and surface charges of the passive films, have been measured. The effect of film formation potential, passivation time, pH and composition of solutions on the parameters are discussed. N-A increases either with lowering film formation potentials or with prolonging passivation times. This is attributed to the transformation of a less hydrated oxide film into a more hydrated form. The changes of E-FB are discussed as a function of adsorptive anions and pH values of electrolyte solution. (C) 2002 Elsevier Science Ltd. All rights reserved.

关键词: chromium;passive film;capacitance;acceptor density;flatband;potential;specific adsorption;electron-transfer reactions;semiconducting properties;stainless-steels;alloying elements;defect structure;iron;impedance;ellipsometry;stability;surfaces

Thermal diffusivity measurement of diamond films

International Journal of Thermophysics

This paper discusses the short-pulse-flash method developed for thermal diffusivity measurements on thin films. Two kinds of CVD diamond film have been prepared, and their thermal diffusivity in the perpendicular direction has been measured with this method. The measurement errors caused by the surface coating are discussed.

关键词: diamond;film;flash method;thermal diffusivity

The depth distribution of residual stresses in (Ti,Al)N films: Measurement and analysis

Journal of Materials Research

A method is introduced to determine the depth distribution of the residual stresses in (Ti,Al)N films. The films were gradually stripped by chemical corrosion, an optical system was designed to test the curvature change of the specimens, and the depth distribution of the residual stresses was calculated. The results show that the residual stresses increase gradually from the interface of film/substrate and reach a maximum value at the middle region, then decrease until the surface.

关键词: x-ray-diffraction;thin-films;coatings;performance;steel

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