材料期刊网

Characterization of{101}*and{100}*α-Si_3N_4 Whiskers by HREM

ZHOU Yanchun ZHOU Jing CHANG Xin XIA Fei SHI Changxu ** Institute of Metal Research , Academia Sinica , Shenyang , 110015 , China+ To whom correspondence should be addressed

材料科学技术（英文）

The microstructure of both {10(?)1} and {10(?)0} (directions perpendicular to the {10(?)1} and {10(?)0} planes) α-Si_3N_4 whiskers were investi- gated by high resolution electron microscopy (HREM).On one side of the {10(?)1} α-Si_3N_4 whiskers many planar defects were ob- served,two kinds of micrograins on one side of the {10(?)0} whiskers were found.In one type,sepa- rated α-Si_3N_4 (28 H) micrograins had the same orientation with respect to the matrix whisker;in the other type,connected polymicrograins consisted of both α-and β-Si_3N_4 (14H).

关键词: α-Si_3N_4 whisker , null , null